The Effect of Frequency and Technology Scaling on Single Event Vulnerability of the Combinational Logic Unit in the Leon2 Sparc V8 Processor

The frequency and technology scaling dependence of single event cross sections are analyzed in a complex combinational logic circuit of the LEON2 SPARC V8 processor. Simulation results show the interaction between the effects of frequency and scaling on upset cross section. Corresponding (and presenting) author: Adam Duncan, Vanderbilt University, VU Station B 351825, Nashville, TN 37235-1825, USA; phone: 615-343-6704, fax: 615-343-6614. Email: [email protected]. Contributing authors: V. Srinivasan, A. Sternberg, L. W. Massengill, B. Bhuva, and W. H. Robinson are with Vanderbilt University, VU Station B 351825, Nashville, TN 37235-1825, USA; phone: 615-3436677, fax: 615-343-9550. Emails: [email protected], [email protected], [email protected], [email protected], [email protected] Session preference: Radiation Effects on Systems and Components Presentation preference: Oral Presentation This work supported in part by the U.S. Navy RHAP program through Draper Laboratories contract DL-H-546316. Unclassified, Distribution unlimited